International Research Journal of Education and Technology

This work presents an advanced approach to fault detection in rough line images using machine learning specifically leveraging deep learning for enhanced pattern recognition by employing the inception v3 algorithm a CNN architecture developed by google the system excels in recognizing various types of faults with high accuracy the approach surpasses traditional methods which often rely on subjective human judgment and are time-consuming this ai- driven solution not only improves the speed and precision of defect detection but also continuously adapts to new data ensuring long-term effectiveness in maintaining the integrity of rough lines in industrial applications .

Key Words:  Machine Learning, Deep Learning, Inception V3 Algorithm Image Processing.